{"product_id":"power-constrained-testing-of-vlsi-circuits-a-guide-to-the-ieee-11494-test-standard-frontiers-in-electronic-testing-22b-1441953159","title":"Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)","description":"\u003cp\u003e\u003cstrong\u003eISBN:\u003c\/strong\u003e 1441953159\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eAuthor:\u003c\/strong\u003e Nicolici, Nicola\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eCondition:\u003c\/strong\u003e New\u003c\/p\u003e\u003cp\u003eThis text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.\u003c\/p\u003e","brand":"Mia Karts","offers":[{"title":"Default Title","offer_id":51931772092704,"sku":"NEW1441953159","price":107.7,"currency_code":"USD","in_stock":true}],"url":"https:\/\/miakarts.com\/products\/power-constrained-testing-of-vlsi-circuits-a-guide-to-the-ieee-11494-test-standard-frontiers-in-electronic-testing-22b-1441953159","provider":"Miakarts Books","version":"1.0","type":"link"}