Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edit...
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Electron and Ion Microscopy and Microanalysis: Principles...
Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
$100.00 CAD
Available
Book Details
- Author
- Lawrence E Murr
- Publisher
- CRC Press
- Format
- Paperback
- Language
- English
- Category
- Electrical & Electronics
- Condition
- New
- ISBN-13
- 9780367402945
- ISBN-10
- 0367402947
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ISBN: 0367402947
Author: Murr, Lawrence E
Condition: New
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
$100.00 CAD
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