- Vendor: Mia Karts
Advances in X-Ray Analysis, Vol. 37
Free U.S. shipping on all orders. Free international shipping on orders over $99
All orders are dispatched the next business day!
Competitive Pricing You Can Trust — Quality You Can Rely On.
ISBN: 0306449013
Author: Gilfrich, John V.
Condition: New
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
Have a question?
Advances in X-Ray Analysis, Vol. 37