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Electromigration and Electronic Device Degradation
$363.54 USD
$290.83 USD
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ISBN: 0471584894
Author: Christou, Aris
Condition: New
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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Electromigration and Electronic Device Degradation
$363.54 USD
$290.83 USD