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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)

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Product description

ISBN: 0367402947

Author: Murr, Lawrence E

Condition: New

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)

$91.92 USD
$73.54 USD
 per 
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