Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (F...
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Power-Constrained Testing of VLSI Circuits: A Guide to th...
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
$103.41 USD
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Book Details
- Author
- Nicola Nicolici
- Publisher
- Springer
- Format
- Paperback
- Language
- English
- Category
- Drafting & Presentation
- Condition
- New
- ISBN-13
- 9781441953155
- ISBN-10
- 1441953159
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ISBN: 1441953159
Author: Nicolici, Nicola
Condition: New
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
$103.41 USD
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