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Thermal-Aware Testing of Digital VLSI Circuits and Systems
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ISBN: 0367607093
Author: Chattopadhyay, Santanu
Condition: New
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
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Thermal-Aware Testing of Digital VLSI Circuits and Systems